Instruments
 
+7 (928) 186-20-38
Olga A. Starovoitova
ENG
RUS
+7 (928) 186-20-38
Olga A. Starovoitova
ENG
RUS
Studies of the structure and properties of chemical compounds, monitoring of chemical processes are carried out using analytical instruments of Center for Collective Use "Nanotechnology" of the South-Russian State Polytechnic University (NPI) (NMR spectroscopy, chromatography, chromatography-mass spectrometry, X-ray diffraction analysis, IR and UV spectroscopy) and the Center for Collective Use of the Zelinsky Institute of Organic Chemistry RAS (NMR spectroscopy, high-resolution mass spectrometry, etc.) within the framework of the basic department of the SRSPU (NPI) at the Zelinsky Institute of Organic Chemistry, RAS.
Scientific equipment of Center for Collective Use "Nanotechnology":
NMR spectrometer Bruker Avance Neo (300 МГц)
Energy dispersive x-ray fluorescence spectrometer ARL QUANT'X (USA) - qualitative and quantitative elemental analysis from sodium (Na) to uranium (U) in solid and liquid samples of any shape, size or composition.
GC-MS Agilent 7890A with mass-selective quadrupole detector MSD 5975C (USA)
Qualitative and quantitative analysis of volatile organic compounds, starting compounds, etc. capillary gas-liquid chromatography-mass spectrometry.
Spectrophotometer "Shimadzu UV-1800" (Japan)
Qualitative and quantitative analysis of organic substances and mixtures by electron spectroscopy in the UV and visible region.
FT-IR spectrometer Varian 640 (USA)
Qualitative and quantitative analysis of organic substances and mixtures by infrared spectroscopy.
EDXRF Spectrometer ARL QUANT'X (USA)
Qualitative and quantitative elemental analysis from sodium (Na) to uranium (U) in solid and liquid samples of any shape, size or composition.
Scanning electron microscope Quanta200 (Netherland)
Combined with X-ray microanalysis system EDAX Genesis XVS 30 - scanning electron microscope is used to study the surface morphology of semiconductor, metallic and non-metallic materials.
Scanning probe microscope Solver HV (Russia)
Scanning probe microscope Solver HV is designed for quantitative and qualitative measurements in high vacuum conditions, to study the surface characteristics and near-surface physical parameters of various objects with nanometer resolution.
Powder X-ray diffractometer ARL X'TRA (Switzerland)
A multifunctional X-ray diffractometer for solving problems of X-ray phase and X-ray structural analysis of powder and solid samples, including identification the composition of polycrystalline materials (qualitative and quantitative analysis) and determining the size of crystallites of various nanomaterials and catalytic systems.
HPLC-system Agilent 1260 Infinity (USA), with a diode array detector (DAD) and an evaporated sample light scattering (ELSD) detector
Designed for high performance liquid chromatography (HPLC) of complex multicomponent mixtures and quantitative determination of thermolabile compounds, including quaternary salts of heterocyclic complexes with transition metals and ligands.
NMR spectrometer Bruker Avance Neo (300 МГц)
Energy dispersive x-ray fluorescence spectrometer ARL QUANT'X (USA) - qualitative and quantitative elemental analysis from sodium (Na) to uranium (U) in solid and liquid samples of any shape, size or composition.
GC-MS Agilent 7890A with mass-selective quadrupole detector MSD 5975C (USA)
Qualitative and quantitative analysis of volatile organic compounds, starting compounds, etc. capillary gas-liquid chromatography-mass spectrometry.
Spectrophotometer "Shimadzu UV-1800" (Japan)
Qualitative and quantitative analysis of organic substances and mixtures by electron spectroscopy in the UV and visible region.
FT-IR spectrometer Varian 640 (USA)
Qualitative and quantitative analysis of organic substances and mixtures by infrared spectroscopy.
EDXRF Spectrometer ARL QUANT'X (USA)
Qualitative and quantitative elemental analysis from sodium (Na) to uranium (U) in solid and liquid samples of any shape, size or composition.
Scanning electron microscope Quanta200 (Netherland)
Combined with X-ray microanalysis system EDAX Genesis XVS 30 - scanning electron microscope is used to study the surface morphology of semiconductor, metallic and non-metallic materials.
Scanning probe microscope Solver HV (Russia)
Scanning probe microscope Solver HV is designed for quantitative and qualitative measurements in high vacuum conditions, to study the surface characteristics and near-surface physical parameters of various objects with nanometer resolution.
Powder X-ray diffractometer ARL X'TRA (Switzerland)
A multifunctional X-ray diffractometer for solving problems of X-ray phase and X-ray structural analysis of powder and solid samples, including identification the composition of polycrystalline materials (qualitative and quantitative analysis) and determining the size of crystallites of various nanomaterials and catalytic systems.
HPLC-system Agilent 1260 Infinity (USA), with a diode array detector (DAD) and an evaporated sample light scattering (ELSD) detector
Designed for high performance liquid chromatography (HPLC) of complex multicomponent mixtures and quantitative determination of thermolabile compounds, including quaternary salts of heterocyclic complexes with transition metals and ligands.